Team:EPF Lausanne/Microfluidics/Making/PartI

From 2014.igem.org

(Difference between revisions)
Line 155: Line 155:
       <td><b>04</b></td>
       <td><b>04</b></td>
       <td><b>Etching of the chrome</b></td>
       <td><b>Etching of the chrome</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" width="60%"/><br />
       Coillard Gravure</td>
       Coillard Gravure</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/a9/Cr_blank_fab4.gif" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/a9/Cr_blank_fab4.gif" /><br />
Line 165: Line 165:
       <td><b>05</b></td>
       <td><b>05</b></td>
       <td><b>Removal of Resist</b></td>
       <td><b>Removal of Resist</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" width="60%"/><br />
       Coillard Photolithographie</td>
       Coillard Photolithographie</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/aa/Cr_blank_fab5.gif" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/aa/Cr_blank_fab5.gif" /><br />
Line 197: Line 197:
       <td><b>01</b></td>
       <td><b>01</b></td>
       <td><b>Substrate:</b> Wafer Clean</td>
       <td><b>Substrate:</b> Wafer Clean</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/7/7b/Tepla.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/7/7b/Tepla.jpg" width="60%"/><br />
       Tepla 300</td>
       Tepla 300</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/7/71/Cl1.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/7/71/Cl1.png" /><br />
Line 208: Line 208:
Photo Resist : Su8 GM1070 – 30μm
Photo Resist : Su8 GM1070 – 30μm
</td>
</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" width="60%"/><br />
       Sawatec</td>
       Sawatec</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/8/82/Cl2.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/8/82/Cl2.png" /><br />
Line 217: Line 217:
       <td><b>03</b></td>
       <td><b>03</b></td>
       <td><b>Relaxation time + Softbake</b></td>
       <td><b>Relaxation time + Softbake</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" width="60%" /><br />
       Sawatec</td>
       Sawatec</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/e8/Cl3.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/e8/Cl3.png" /><br />
Line 227: Line 227:
       <td><b>04</b></td>
       <td><b>04</b></td>
       <td><b>Photolith:</b>UV exposure</td>
       <td><b>Photolith:</b>UV exposure</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/91/MaskAligner.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/91/MaskAligner.jpg" width="60%"/><br />
       Mask Aligner</td>
       Mask Aligner</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/ab/Cl4.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/a/ab/Cl4.png" /><br />
Line 237: Line 237:
       <td><b>05</b></td>
       <td><b>05</b></td>
       <td><b>Post exposure bake</b></td>
       <td><b>Post exposure bake</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/0/04/Sawatec.jpg" width="60%"/><br />
       Sawatec</td>
       Sawatec</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/98/Cl5.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/98/Cl5.png" /><br />
Line 254: Line 254:
       <td><b>07</b></td>
       <td><b>07</b></td>
       <td><b>Photolith:</b> Develop</td>
       <td><b>Photolith:</b> Develop</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/8/89/Wetbench.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/8/89/Wetbench.jpg" width="60%"/><br />
       Wetbench plane solvent</td>
       Wetbench plane solvent</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/f/f5/Cl6.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/f/f5/Cl6.png" /><br />
Line 264: Line 264:
       <td><b>08</b></td>
       <td><b>08</b></td>
       <td><b>Hard bake</b></td>
       <td><b>Hard bake</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/3d/Dataplate.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/3d/Dataplate.jpg" width="60%"/><br />
       DataPlate </td>
       DataPlate </td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/f/f5/Cl6.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/f/f5/Cl6.png" /><br />
Line 289: Line 289:
       <td><b>01</b></td>
       <td><b>01</b></td>
       <td><b>Substrate:</b> Si test Priming</td>
       <td><b>Substrate:</b> Si test Priming</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/b/b3/YES.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/b/b3/YES.jpg" width="60%"/><br />
       YES III</td>
       YES III</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/35/Fl1.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/35/Fl1.png" /><br />
Line 300: Line 300:
Photo Resist : AZ9260 – 14μm
Photo Resist : AZ9260 – 14μm
</td>
</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/c/c2/Evg.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/c/c2/Evg.jpg" width="60%"/><br />
       EVG 150</td>
       EVG 150</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/2/26/Fl2.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/2/26/Fl2.png" /><br />
Line 317: Line 317:
       <td><b>04</b></td>
       <td><b>04</b></td>
       <td><b>Photolith:</b>UV exposure</td>
       <td><b>Photolith:</b>UV exposure</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/91/MaskAligner.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/9/91/MaskAligner.jpg" width="60%"/><br />
       Mask Aligner</td>
       Mask Aligner</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/6/66/Fl3.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/6/66/Fl3.png" /><br />
Line 334: Line 334:
       <td><b>06</b></td>
       <td><b>06</b></td>
       <td><b>Photolith:</b> Develop</td>
       <td><b>Photolith:</b> Develop</td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/c/c2/Evg.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/c/c2/Evg.jpg" width="60%"/><br />
       EVG 150</td>
       EVG 150</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/5/5c/Fl4.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/5/5c/Fl4.png" /><br />
Line 344: Line 344:
       <td><b>07</b></td>
       <td><b>07</b></td>
       <td><b>Rinse with Deionized water</b></td>
       <td><b>Rinse with Deionized water</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/e/ed/Coillard.jpg" width="60%"/><br />
       Coillard Wetbench</td>
       Coillard Wetbench</td>
       <td class="cntr">Rinse wafers in Quick Dump Rinse then in Ultra Clean bath, using wetbench
       <td class="cntr">Rinse wafers in Quick Dump Rinse then in Ultra Clean bath, using wetbench
Line 353: Line 353:
       <td><b>08</b></td>
       <td><b>08</b></td>
       <td><b>Bake to round edges</b></td>
       <td><b>Bake to round edges</b></td>
-
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/3d/Dataplate.jpg" /><br />
+
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/3/3d/Dataplate.jpg" width="60%"/><br />
       DataPlate</td>
       DataPlate</td>
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/2/26/Fl5.png" /><br />
       <td class="cntr"><img src="https://static.igem.org/mediawiki/2014/2/26/Fl5.png" /><br />

Revision as of 15:22, 11 October 2014

The following processes will explain the making of a mask and a positive/negative resist wafer.

A wafer is used as a mold to make the microfluidic layer.

A photoresist is a light-sensitive material used in several industrial processes, such as photolithography and photoengraving to form a patterned coating on a surface:

-A negative resist is a type of photoresist in which the portion of the photoresist that is exposed to light crosslinks and thus becomes insoluble to the photoresist developer. The unexposed portion of the photoresist is dissolved by the photoresist developer.

- A positive resist is a type of photoresist in which the portion of the photoresist that is exposed to light becomes soluble to the photoresist developer. The portion of the photoresist that is unexposed remains insoluble to the photoresist developer.

Mask process and outline

Step Process description Machines Cross-section after process
01
Cross section of a photolithography mask
02 Laser exposure
Heidelberg DWL200, Laser lithography system

The laser beams on the surface of the photoresist. By doing so, it imprints the pattern of the design on the PR.
03 Developing of the mask
DV10 Mask and Thick positive resist developer

A chemical treatment is used to remove the PR that was exposed by the laser in the previous step, creating the ‘holes’ on the photoresist
04 Etching of the chrome
Coillard Gravure

The chrome is removed at the sites where the resist layer is missing, using an acid bath.
05 Removal of Resist
Coillard Photolithographie

Once the chrome is removed at the precise sites (previous step), the rest of the resist is removed from the whole surface.
06 Use of mask
The mask can now be used to expose its pattern on the wafer using UV light

Control Layer Process outline

Step Process description Machines Cross-section after process
01 Substrate: Wafer Clean
Tepla 300

Clean the wafer using plasma treatment
02 Photolith: Resist deposition Photo Resist : Su8 GM1070 – 30μm
Sawatec

A layer of negative photoresist is added on the wafer by spincoating
03 Relaxation time + Softbake
Sawatec

Softbake wafer using Sawatec hotplate, to solidify the photo resist
04 Photolith:UV exposure
Mask Aligner

The UV lights are exposed through the Mask on the surface of the wafer. By doing so, it imprints the pattern of the design on the PR.
05 Post exposure bake
Sawatec

Bake wafer using Sawatec hotplate
06 Relaxation delay Wait 1 hour – overnight
07 Photolith: Develop
Wetbench plane solvent

This removes the unexposed photoresist from the wafer using chemical treatment on a wet bench
08 Hard bake
DataPlate

Bake 135°C 2 hours, using an oven

Flow layer process outline

Step Process description Machines Cross-section after process
01 Substrate: Si test Priming
YES III

Dehydrate and prime with HMDS, using the oven to create hydrophobic surface on the wafer, to prepare the wafer for coating
02 Photolith: Resist deposition Photo Resist : AZ9260 – 14μm
EVG 150

A layer of positive photoresist is added on the wafer by spincoating
03 Rehydratation time Wait minimum 1 hour, maximum 3 days
04 Photolith:UV exposure
Mask Aligner

The UV lights are exposed through the Mask on the surface of the wafer. By doing so, it imprints the pattern of the design on the PR.
05 Develop immediately Wait maximum 1 hour before develop
06 Photolith: Develop
EVG 150

This removes the exposed photoresist from the wafer using chemical treatment with the EVG 150
07 Rinse with Deionized water
Coillard Wetbench
Rinse wafers in Quick Dump Rinse then in Ultra Clean bath, using wetbench
08 Bake to round edges
DataPlate

Bake in horizontal position, 160°C 2 hours

Sponsors